Potentiometric and magnetic force microscopy in multilayers

The simultaneous collection of magnetic, topographic and potentiometric data has been achieved using a modified magnetic force microscope (MFM). Use of a reference sample confirmed that there was no interference between magnetic and potentiometric channels. Images of domain walls and of the surface potential in a Co/Cu multilayer system have been obtained. Domain walls observed are consistent with those obtained using conventional MFM whilst potentiometry revealed a constant background with small areas of higher or lower potential.