Méthode de traitement des interférogrammes à deux ondes pour accroître leur sensibilité

Two-beam interference fringes are not always able to give sufficient information to determine the topography of very weakly deformed wave surfaces. The process described allows us to intercalate several intermediate levels, which vary linearly in terms of the phase, between the brightness extrema of a fringe. The interference pattern is submitted to an optoelectronics treatment where the photoelectric signal is compared with an adjustable electric reference signal.