Gate-Driver with Full Protection for SiC-MOSFET Modules

This paper is presenting an advanced method of full protection by the gate driver unit for a SiC-MOSFET module using its sense terminals. The presented test results are including features like an adjustable overcurrent and short-circuit detection together with a Soft Shut Down function and Active Clamping, which is reducing the occurring over-voltage spikes at turn-off actively.