Impact of supply voltage and particle LET on the soft error rate of logic circuits

Heavy-ion irradiations of 14/16-nm node bulk FinFET combinational logic circuits under different supply voltage and frequency are investigated. Results indicate that particle LET strongly affects logic soft-error rate (SER). Single-event transient (SET) experimental data and models for logic SER are used to explain the differences in SER for low-LET particles and high-LET particles.