High-energy x-ray phase tomography using grating interferometer with structured anode x-ray source

Talbot-Lau interferometers are widely used for X-ray phase imaging/tomography. For thick objects or materials including metals, high-energy X-rays should be used. However, absorption gratings with extremely high aspect-ratios (AR) are necessary but are hard to be fabricated by current microfabrication techniques. As an approach without using high-AR absorption gratings, we developed the high-energy X-ray phase imaging device with a structured anode X-ray source, which has tungsten target array embedded in a diamond substrate. X-rays are emitted from the tungsten region, and therefore G0 can be omitted. We will show the results of high-energy X-ray phase imaging and tomography performed with a design energy of 82 keV.