Scanning Probe Microscope

Abstract : This DURIP allowed us to purchase a Digital Instruments Dimension 3100 Atomic Force Microscope (AFM), which is a versatile tool that can serve dual functions, both as an AFM and a scanning-tunneling microscope (STM) . The AFM and the STM are separated units and are mounted on two different stages both of which minimize external noise and vibration. Within the purview of each of these units lie several modes of imaging. As an AFM, imaging is done in two modes namely the tapping mode and the contact mode. These modes have the capability of resolving step heights of a few angstroms and have a be done in several ways depending upon the kind of atoms that one is imaging.