Intrinsic ferromagnetism in wurtzite (Ga,Mn)N semiconductor

Intrinsic ferromagnetism in the high-quality wurtzite Ga{sub 0.937}Mn{sub 0.063}N semiconductor is unambiguously demonstrated by both macroscopic magnetization measurements and x-ray magnetic circular dichroism. The structural quality of the samples grown by plasma-assisted molecular beam epitaxy is confirmed by x-ray diffraction and x-ray linear dichroism. The Curie temperature of a (Ga,Mn)N sample with 6.3% Mn is {approx_equal}8 K with a spontaneous magnetic moment of 2.4{mu}{sub B} per Mn at 2 K.