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Ballistic Electron Emission Microscopy Studies of Ferromagnet - Semiconductor Interfaces
Ballistic Electron Emission Microscopy Studies of Ferromagnet - Semiconductor Interfaces
2004
P. G. Mather
A. C. Perrella
A. Yurtsever
R. A. Buhrman
Keywords:
Ballistic electron emission microscopy
Condensed matter physics
Materials science
Semiconductor
Ferromagnetism
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