New Insights into Ferroelectric Domain Imaging with Piezoresponse Force Microscopy

Piezoresponse Force Microscopy (PFM) has become the most used technique for non-invasive mapping of ferroelectric domain patterns. For PFM imaging, no specific sample preparation is required: any clean and flat surface that can be imaged by scanning force microscopy can also be investigated by PFM. Despite its ease of use, PFM imaging allows to detect the domain distribution with high lateral resolution and an amazing sensitivity. As a consequence, the PFM mode has become a standard for commercial scanning force microscopes. PFM, however, still causes difficulties in terms of interpretation of the images obtained. The situation becomes even more delicate, when trying to obtain quantitative data based on PFM images.