Analysis of Various Types of SEU Data

This chapter contains sections titled: Critical Charge Depth and Critical Charge Charge Collection Mechanisms Charge Collection and the Cross-Section Curve Efficacy (Variation of SEU Sensitivity within a Cell) Mixed-Mode Simulations Parametric Studies of Device Sensitivity Influence of Ion Species and Energy Device Geometry and the Limiting Cross Section Track Size Effects Cross-Section Curves and the Charge Collection Processes Single Event Multiple-Bit Upset SEU in Logic Systems Transient Pulses