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TCAD modeling and characterization of short-range variations in multiple-gate devices and circuit blocks
TCAD modeling and characterization of short-range variations in multiple-gate devices and circuit blocks
2008
Baravelli
Speciale
Dixit
Jurczak
Keywords:
Range (statistics)
line edge roughness
Stochastic process
Materials science
characterization
Optoelectronics
CMOS
Correction
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