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Fabrication of 2-Terminal Memory Test Element with 100 nm Diameter or Smaller
Fabrication of 2-Terminal Memory Test Element with 100 nm Diameter or Smaller
2019
Ryo Fukuoka
Hiroki Tokuhira
Katsuyoshi Komatsu
Koji Matsuo
Hide Tanaka
Gaku Sudo
K. Ohuchi
Keywords:
Fabrication
Materials science
Optoelectronics
memory test
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