Advanced Coherent X-ray Diffraction and Electron Microscopy of Individual InP Nanocrystals on Si Nanotips for III-V-on-Si Electronics and Optoelectronics

Let's talk about your flaws\dots{} The authors present nondestructive examination of the crystallographic properties (including crystal size, facet shape, strain, and defects) of lone InP nanocrystals (NC) grown on Si nanostructures. This sort of three-dimensional structured imaging is of great significance in evaluating the quality of the active nanomaterials in fully processed nanoelectronic and nano-optoelectronic devices, even in an $o\phantom{\rule{0}{0ex}}p\phantom{\rule{0}{0ex}}e\phantom{\rule{0}{0ex}}r\phantom{\rule{0}{0ex}}a\phantom{\rule{0}{0ex}}n\phantom{\rule{0}{0ex}}d\phantom{\rule{0}{0ex}}o$ manner.