Structural, Morphological and Dielectric Spectroscopy Analysis of Double Perovskite Bi2MnNiO6 Electronic Material

Exploring as well as examining novel functional double perovskite material represents an important aspect in the field of electronic devices. In this present study the electronic material Bi2MnNiO6 has been framed through high temperature solid state ceramic processing method. Its electronic structure, morphological and electrical characteristics has been evaluated. Its structure is found to be monoclinic through XRD analysis. The uniform and compact grain distribution has been observed form the micrographs. The impedance analysis of the ceramic suggests negative temperature coefficient of resistance behaviour. The important electrical properties associated with this compound may be essential in the development of next generation electronic devices.