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Evaluation of long-term reliability of 4H-SiC(0001) CMOS ring oscillators at high temperature
Evaluation of long-term reliability of 4H-SiC(0001) CMOS ring oscillators at high temperature
2021
Kidist Moges Ayele
Takuma Kobayashi
Takuji Hosoi
Takayoshi Shimura
Keita Tachiki
Tsunenobu Kimoto
Heiji Watanabe
Keywords:
ring
Reliability (semiconductor)
Materials science
Electronic engineering
Term (time)
CMOS
Correction
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