Photon counting in x‐ray diffraction

The photon counting method is proposed for the field of A x‐ray diffraction. For this purpose, a new memory device was developed. The photon distribution and the photon autocorrelation were measured, and high‐intensity sources such as the rotating anode generator and the Photon Factory were characterized. It has been shown that the method is useful to investigate time‐dependent phenomena on the time scale down to 10 μs.