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Configuration And Displacement Measurement Using Vision Metrology
Configuration And Displacement Measurement Using Vision Metrology
2002
Miura Satoru
Yamamoto Takuji
Imai Michio
Iwano Keita
Ohnishi Yuzo
Nishiyama Satoshi
Keywords:
Dimensional metrology
Metrology
Computer vision
Artificial intelligence
Physics
Optics
Geology
Correction
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