Development of a statistical approach for DNA-based nanowires electrical study

The last decade, an important effort has been allocated to emergent nanomaterials as an alternative route to current silicon-based technologies in order to face physics issues appearing with the downscaling of electronics components (Moore's law). In this paper, studies on DNA material have been conducted in order to take advantage of both DNA nanoscale and auto-assembling properties. The combination of these two properties is very promising for building a new generation of DNA-based interconnects. However, since the first metallized DNA wire developed by Erez Braun in 1998, one of the major issues met by researchers is the low electrical performances achieved on DNA-based nanowires used as interconnections. In this project, we are developing a statistical approach to determine the electrical properties of metallized DNA nanowires relying upon the deposition and alignment of a large population of nanowires on a silicon substrate equipped with different metallic electrode sets.