Statistical Compact Testing of Binary Systems using Spectral Data

Statistical compact test scheme for fault detection in binary logical system is presented here utilizing a subset of Rademacher-Walsh spectra covering the entire-range of stuck-at faults on input lines. The results obtained are useful for getting circuit signature, test length critical region and power of test. The performance of the scheme has been analyzed in terms of the probabilities of rejecting a good circuit and accepting a bad one. The proposed test scheme is time efficient and is capable of covering the entire set of stuck-at faults on the input lines.