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Determination of the nonlinear contribution to refraction of compressed xenon at lambda = 308 nm by the self-diffraction method
Determination of the nonlinear contribution to refraction of compressed xenon at lambda = 308 nm by the self-diffraction method
1999
V. V. Bertsev
S. F. Bureiko
A. Yu. Karklit
A. A. Pastor
P. Yu. Serdobintsev
Keywords:
Optics
Refraction
Xenon
Diffraction
Physics
Nonlinear system
Correction
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