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SRAM Bitmap Validation Using Laser-Induced Damage for FinFET ICs
SRAM Bitmap Validation Using Laser-Induced Damage for FinFET ICs
2016
William Lo
Puneet Gupta
Rakshith Venkatesh
Rudolf Schlangen
Roy Ng
Jane Li
Howard Lee Marks
Bruce Cory
Keywords:
Static random-access memory
Optoelectronics
Laser
Bitmap
Computer science
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