Old Web
English
Sign In
Acemap
>
Paper
>
Image processing methods for interferometric shape deviation measurements with sub-micron resolution
Image processing methods for interferometric shape deviation measurements with sub-micron resolution
2016
Dawid Kucharski
Frans Meijer
E. Stachowska
Keywords:
Micrometre
Surface metrology
Interferometry
Computer vision
Optics
Image processing
Physics
Artificial intelligence
shape deviation
optical measurements
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]