Scanning Moire Fringe Method: A Superior Approach to Perceive Defects, Interfaces, and Distortion in 2D Materials.
2020
Scanning moire fringe (SMF) is a widely utilized technique for the precise measurement of the strain field in semiconductor transistors and heterointerfaces. With the growing challenges of traditio...
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
33
References
2
Citations
NaN
KQI