A Thin High-Efficiency Polarization Rotation Reflective Surface for X-Band Applications

The paper deals with a thin polarization rotation conversion for X-band applications which can reflect the linearly-polarized incident wave with 90¼ polarization rotation. The proposed pattern is implemented numerically as well as experimental effort. The combination of L-shaped and grounded vias as a small rotator has expressed rotation bandwidth of 1.33 GHz from 9.53 GHz to 10.86 GHz. Given the pattern, the phase difference is about 180¼ across the conversion bandwidth. Moreover, the polarization conversion rate (Pf.R) is approximately 96% at 9.79 GHz. Reduction in thickness of the structure to $0.051\lambda_{0}$ as well as a compact dimension $(0.32\lambda_{0})$ has been undertaken. The fabricated prototype has verified the numerical simulation.