Temperature Controlled Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10−7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.