Structural and dc conduction studies on PbTe thin films

Lead Telluride (PbTe) films of different thickness were prepared onto precleaned glass substrates under the pressure of 2 × 10−5 Torr by thermal evaporation. X-ray diffraction technique, scanning electron microscopy, and current–voltage characteristics were used to characterize the films. The structural analysis of the films was carried using X-ray diffractometer. The surface morphology was analyzed by using scanning electron microscope. The dc electrical conduction mechanism in vacuum-evaporated Al/PbTe/Al thin film sandwich system in the thickness range 500–5,000 A at different temperature (303–483 K) was found to be a modified Poole–Frenkel type. The results of variation of activation energy with applied voltage and thickness are discussed.