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EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates
EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates
2009
Boryana Rashkova
Zaoli Zhang
Sašo Šturm
Gerald Kothleitner
Kerstin Kutschej
Christian Mitterer
Petr Lazar
Josef Redinger
Raimund Podloucky
Christina Scheu
Gerhard Dehm
Keywords:
Materials science
Ab initio quantum chemistry methods
Physical chemistry
Tin
K-edge
Correction
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