Correlation between energy loss and ion-induced electron emission of 1 MeV protons channeled along the 〈100〉 axis of a thin silicon crystal

Abstract Energy loss of channeled ions and ion-induced electron emission (IIEE) are principally governed by electronic stopping. The authors report experimental observations of the angular dependence of the energy loss and the corresponding IIEE yields of channeled protons near the 〈100〉 direction in a thin silicon crystal. The Rutherford backscattering spectrometry (RBS) yield drops to a minimum in the channeled condition as also do the transmitted-ion energy loss and the IIEE yields (forward, backward and total). For 1 MeV protons, the effective IIEE yields in the channeled condition are reduced in approximately the same proportion as the electronic stopping power. The present data support a modification of Schou's theory of IIEE.