Crystal Growth and Characterization of Alexandrite
2012
Large, high-quality alexandrite single crystals (Cr-doped Al2BeO4) with dimensions of up to 120 mm were grown from molten alexandrite-based fluxes in the temperature range of 1800–1853 °C using the Stepanov and Kyropoulos methods. Etching experiments resulted in a maximum pits density of 105 cm–2. Powder X-ray diffraction was used to establish the dependence of unit cell dimensions on the Cr content. Optical absorption spectroscopy (UV–vis) revealed nonlinear absorption dependence on the Cr content.
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