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Transparent Conductive Oxide / Encapsulant Interface Characterization with Surface Analysis Techniques
Transparent Conductive Oxide / Encapsulant Interface Characterization with Surface Analysis Techniques
2012
Christophe Ballif
Laure-Emmanuelle Perret-Aebi
P Dafniotis
F. de Borman Chautems
Silvia Schreiber
S. Pélisset
Katherine M. Stika
Keywords:
Optoelectronics
Encapsulation (computer programming)
Materials science
Transparent conducting film
Correction
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