Ellipsometric study of the optical properties of n-type superconductor La 1.9 Ce 0.1 CuO 4

Two thin La2-xCexCuO4 (x = 0.1) films were deposited on [001]-oriented SrTiO3 substrates by pulsed-laser deposition. The as-prepared LCCO films were well studied by X-ray diffraction, atomic force microscopy, transmission electron microscopy and spectroscopic ellipsometry. Spectroscopic ellipsometry provides a nondestructive, fast, and accurate method to explore the optical properties of the superconductive materials. The thickness and the optical dispersion model of the LCCO films in the visible range are presented for the first time. The results show that minor differences in the annealing progress will cause a relatively large change in the optical properties of the LCCO films.