Capture andShift Toggle Reduction (CASTR)ATPG toMinimize PeakPowerSupply Noise

Excessive peakpowersupply noise (PPSN)causes yield loss problem during test. Toreduce PPSN,weproposed a newtechnique called Capture andShift Toggle Reduction (CASTR). CASTRperforms powerreduction during dynamic test compaction sothetest length overhead is verysmall. Italsoincludes pseudo Boolean optimization (PBO)andrandom-based techniques toimprove the results. Experimental results showthat wecanreduce flipflop toggles, whichishighly correlated withPPSN,by 33.4%during shift modeand41.2%incapture operation simultaneously forthelarge ISCAS89 benchmarks.