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Correlation between Flatband Voltage Shift in MOS Capacitors and Endurance Degradation of EEPROM Cells
Correlation between Flatband Voltage Shift in MOS Capacitors and Endurance Degradation of EEPROM Cells
1987
Manthey
Dutoit
Ilegems
Keywords:
Stress (mechanics)
EEPROM
Current density
Optoelectronics
flat band
EPROM
degradation
Materials science
Capacitor
Correction
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