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Impact of layer thickness variations of SOI-wafer on ESD-robustness
Impact of layer thickness variations of SOI-wafer on ESD-robustness
2003
Graf
Bychikhin
Dietz
Dudek
Pogany
Gornik
Soppa
Wolf
Keywords:
Temperature measurement
Optoelectronics
Silicon on insulator
Robustness (computer science)
Wafer
smart power technology
Electrostatic discharge
power integrated circuits
layer thickness
Materials science
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