Method for control of profile parameters of graded-index planar waveguides

The simple nondestructive method for reconstruction of the refractive index distribution in the waveguide cross section is presented. Waveguide surface immersing and the interferometric method of registration are utilized in this technique. The interference model is discussed.© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.