Miniaturization of NIR/SWIR image sensors enabled by thin-film photodiode monolithic integration

In this paper, we present short-wave infrared (SWIR) image sensors with high pixel density. Quantum dot (QD) photodiode stack is monolithically integrated on custom, 130 nm node CMOS readout circuit. State-of-the-art pixel pitch of 1.82 μm is demonstrated in focal plane arrays sensitive at eye-safe region above 1400 nm wavelength. Thin-film photodiode (TFPD) technology will facilitate realization of ultra-compact SWIR sensors for future XR applications, including eye-safe tracking systems and enhanced vision.