Measurement and Characterization of High Power Devices for mmW Applications

Nonlinear analysis of active components in microwave engineering is an essential but complicated process for accurate characterization and modeling, especially for mmW applications. Designing and implementing a tailored measurement setup system for mmW applications can provide a wide variety of data to analyze with many parameters using the same setup, such as small-signal response, pulsed DC-IV, pulsed S-parameters, vector data of harmonics, time-domain information, and modulated signal response. These measurements are also required for a complete characterization of an active device. In this study, linear and nonlinear measurement types with their calibration methods for high-power mmW RF device characterization and modeling are presented. Advanced mmW measurement setup configurations are explained and their performances are compared by considering their capabilities.