Influence of Band Discontinuities at Source-Channel contact in Tunnel FET Performance

in Tunnel FET Performance Yan Wu, H. Hasegawa, K. Kakushima, K. Ohmori, T. Watanabe, H. Wakabayashi, K. Tsutsui,A. Nishiyama, N. Sugii, Y. Kataoka, K. Natori, K. Yamada and H. Iwai Frontier Research Center, Tokyo Institute of Technology Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsua, Midori-ku, Yokohama 226-8502, Japan Honors Graduate Program for Nanotech/Sciences, University of Tsukuba, Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan Institute for Nanoscience and Nanotechnology, Waseda University, Shinjuku, Tokyo 169-8555, Japan 2 University of TSUKUBA, 1-1-1, Tenodai, Tsukuba, Ibaraki, 305-8573, Japan Tel: +81-45-924-5847, Fax: +81-45-924-5846, E-mail:yan.w.ab@m.titech.ac.jp