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Cr based attenuated phase shifting mask materials for 193nm lithography
Cr based attenuated phase shifting mask materials for 193nm lithography
1996
E. Kim
S. B. Hong
Z. T. Jiang
Kwangsoo No
S. Lim
S-G Woo
Y.B. Koh
Keywords:
Lithography
Phase (waves)
Optics
Materials science
Optoelectronics
Correction
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