Inversion-voltammetric determination of the content of microquantities of alloying components (tellurium, zinc, and cadmium) in microsamples of indium antimonide crystals

The determination of alloying components and impurities in microsamples collected from set portions of crystals is important in the study of the nature of their distribution in the volume of crystals produced under conditions of weightlessness, under the action of magnetic fields, and under other external influences. The authors develop methods for determining Zn, Cd, and Te in microsamples of indium antimonide crystals, alloyed with these elements. Mass analyses of one of the samples are cited. The relative standard deviation does not exceed 0.20. Data were used to calculate the distribution coefficient of these components between liquid and solid phases during the growing of semiconductor crystals in the presence of external magnetic fields and other influences.