Анализ магнитного вклада в коэффициенты Френеля при магнитоэллипсометрических исследованиях

The ellipsometric measurement features of the ferromagnetic samples under the influence of an external magnetic field are shown. The analytical expressions for the Fresnel coefficients are presented with regard to the magnetooptical parameter in the off-diagonal elements of the dielectric permittivity. The model of a homogeneous semi-infinite medium, one-layer model, and the multilayer model of the reflective optical systems in the presence of a magnetic field in the equatorial magneto-optical Kerr effect configuration are analyzed. These models permit to interpret the experimental data of the ellipsometric and magneto-ellipsometric studies of layered magnetic nanostructures. For the first time the relationship of the ellipsometric parameters Ψ and A with magneto-optical parameter Q is obtained, δΨ and SA corrections in the ellipsometric angles are evaluated due to the equatorial surface magnetooptical Kerr effect. As a result, it becomes possible to measure the magnetic characteristics of the layered nanostructures, such as the hysteresis loop and coercivity with the conventional ellipsometric apparatus.