Easy and accurate method for the characterisation of dielectric materials at X-band

A method of characterising dielectric materials at microwave frequencies is described. The technique overcomes the problem of airgaps in the commonly used `filled-cavity? technique. Results of measurements of the permittivity/temperature characteristics of both quartz and a titanium loaded composite dielectric with a negative slope are presented. The accuracy of the technique is described and a high degree of repeatability demonstrated.