InP:Yb layers grown by adduct metalorganic vapor phase epitaxy using Yb(MeCp)3

Highly doped InP:Yb layers have been grown by adduct metalorganic vapor phase epitaxy at atmospheric pressure. Yb(MeCp)3, where Me=CH3 and Cp=n5‐C5H5, was synthesized as Yb source material because of its relatively high vapor pressure at acceptable source temperatures. The layers were grown in a wide range of growth temperatures (560–670 °C) and Yb mole fractions (10−9–10−7). In photoluminescence experiments they showed strong Yb3+‐4f emission. The layers were further characterized by Hall measurements and secondary‐ion mass spectroscopy. In order to obtain n‐type InP:Yb samples with high carrier concentrations we have grown InP layers double doped with S and Yb.