An Accurate Jitter Estimation Technique

One of the popular and efficient approaches for testing a high-speed transceiver is based on the loopback principle. Even though the BER can be measured in the loopback mode using a pattern generator and an error detector in a transceiver, only the I/O performance margin (e.g. timing margin) is guaranteed in production testing due to excessively long testing time for low BER measurement [8, 9]. However, as we illustrated in Chapter 5, such a test might not detect some chips that fail the BER specification when the RJ accounts for a non-trivial fraction of the TJ.