Analysis of the Structural Features of Weakly Ordered Layers in Accordance with Data on X-Ray Reflectometry and Grazing Incidence Diffraction

A method for determining the structural parameters of the Langmuir molecular layer in accordance with data on X-ray reflectometry and grazing incidence diffraction is proposed. These techniques complement each other, because scattering in the layer plane is measured using one method; and that in its cross section, by means of another. A method for seeking the lattice parameters in weakly ordered layers is implemented by minimizing residuals between experimental and calculated peak positions on grazing-incidence-diffraction curves and by comparing the results of these two measurement techniques. It is assumed that it is possible to verify both the correspondence of all reflections to one structure at the same time and the attribution of individual reflections to different variants of packing and the subsequent choice of most adequate solutions. The use of the method for indicating peaks on the curve for the grazing-incidence diffraction intensity and for determining the parameters of structures formed in such a Langmuir layer is given as an example.