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Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography
Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography
2012
Michael R. Johnson
David J. Smith
Lin Zhou
Martha McCartney
David A. Cullen
Keywords:
Analytical chemistry
Electron holography
Polarization (waves)
Nitride
Materials science
High-electron-mobility transistor
Optics
Correction
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