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Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (SOLEIL)
Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (SOLEIL)
2016
C. Mocuta
M.-I. Richard
S. Stanescu
A. Barbier
J. Fouet
C. Guichet
S. Hustache
Dominique Thiaudière
A. Dawiec
Nicolas Leclercq
O. Thomas
Keywords:
Thin film
Beamline
Data acquisition
Analytical chemistry
Materials science
Optics
Correction
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