Modeling and Performance Metrics for Longitudinal Chromatic Aberrations, Focus- drilling, and Z-noise; Exploring excimer laser pulse-spectra
2007
The combined impact of longitudinal chromatic aberrations, focus-drilling, and Z-noise on several lithographic
performance metrics is described. After review, we investigate an improved method for simulating the lithographic
behavior of longitudinal chromatic aberrations stemming from the finite bandwidth of excimer laser pulse-spectra
using PROLITH TM v. 9.3.3. Additionally, we explore two methods for modeling the lithographic improvements related
to focus-drilling and new PROLITH functionality for modeling the effects of Z-noise. Our case studies involve reinvestigating
the RELAX process and providing a framework for accurate lithographic simulation using machine
specific pulse-spectral data, modified Lorentzian, and Gaussian models. After presentation and analysis, we discuss
potential applications including methods for improved focus budgets and improved mask design.
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