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Lateral Size of Graphene Characterized by Atomic Force Microscope
Lateral Size of Graphene Characterized by Atomic Force Microscope
2019
Zheng Liu
Wenjun Liu
Xue Xie
Weifang Zhao
Yu Wen
Qinsheng Wang
Bingxian Ou
Keywords:
Graphene
Optoelectronics
Materials science
Atomic force microscopy
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