Transport properties of Nd1−xFexOF polycrystalline films

I. Corrales-Mendoza,Victor Tapio Rangel-Kuoppa,Agustin Conde-Gallardo

Transport properties of Nd1−xFexOF polycrystalline films

2013

I. Corrales-Mendoza
Victor Tapio Rangel-Kuoppa
Agustin Conde-Gallardo

The transport properties of Nd1−xFexOF films with 0.2Ohmic contacts were formed in a van der Pauw geometry, soldering Woods metal, for Hall effect measurements. All samples showed n-type nature, with a charge carrier density (n) on the order of 1018 cm−3, increasing as x increases. As a function of temperature, n and mobilities have almost constant values. The temperature dependence of the electrical conductivity indicates that the transport properties are not governed by a typical band conduction mechanism but by a variable range hopping process.

Keywords:

Hall effect
Van der Pauw method
Crystallite
Variable-range hopping
Ohmic contact
Electrical resistivity and conductivity
Atmospheric temperature range
Condensed matter physics
Thermal conduction
Materials science

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